Calvet, W. Et Al. 2014. Thickness dependent investigation of wedged Cu(In,Ga)Se2 films prepared by physical vapor deposition (PVD) using hard x-ray photoelectron spectroscopy (HAXPES). E-MRS Spring Meeting , (Lille, France).

Calvet, W., ÜMSÜR, B., Steigert, A., Höpfner, B., Lauermann, I., Prietzel, K., ... Kaufmann, C. A.(2014). Thickness dependent investigation of wedged Cu(In,Ga)Se2 films prepared by physical vapor deposition (PVD) using hard x-ray photoelectron spectroscopy (HAXPES) . E-MRS Spring Meeting, Lille, France

Calvet, W. Et Al. "Thickness dependent investigation of wedged Cu(In,Ga)Se2 films prepared by physical vapor deposition (PVD) using hard x-ray photoelectron spectroscopy (HAXPES)," E-MRS Spring Meeting, Lille, France, 2014

Calvet, W. Et Al. "Thickness dependent investigation of wedged Cu(In,Ga)Se2 films prepared by physical vapor deposition (PVD) using hard x-ray photoelectron spectroscopy (HAXPES)." E-MRS Spring Meeting , Lille, France, 2014

Calvet, W. Et Al. (2014) . "Thickness dependent investigation of wedged Cu(In,Ga)Se2 films prepared by physical vapor deposition (PVD) using hard x-ray photoelectron spectroscopy (HAXPES)." E-MRS Spring Meeting , Lille, France.

@conferencepaper{conferencepaper, author={W. Calvet Et Al. }, title={Thickness dependent investigation of wedged Cu(In,Ga)Se2 films prepared by physical vapor deposition (PVD) using hard x-ray photoelectron spectroscopy (HAXPES)}, congress name={E-MRS Spring Meeting}, city={Lille}, country={France}, year={2014}}