YILDIZ, D. E. And KANBUR ÇAVUŞ, H. 2017. ELECTRICAL PROPERTIES OF Al/p-Si STRUCTURE WITH Al2O3 THIN FILM FABRICATED BY ATOMIC LAYER DEPOSITION SYSTEM. SURFACE REVIEW AND LETTERS , vol.24, no.6 .

YILDIZ, D. E., & KANBUR ÇAVUŞ, H., (2017). ELECTRICAL PROPERTIES OF Al/p-Si STRUCTURE WITH Al2O3 THIN FILM FABRICATED BY ATOMIC LAYER DEPOSITION SYSTEM. SURFACE REVIEW AND LETTERS , vol.24, no.6.

YILDIZ, DİLBER, And HATİCE KANBUR ÇAVUŞ. "ELECTRICAL PROPERTIES OF Al/p-Si STRUCTURE WITH Al2O3 THIN FILM FABRICATED BY ATOMIC LAYER DEPOSITION SYSTEM," SURFACE REVIEW AND LETTERS , vol.24, no.6, 2017

YILDIZ, DİLBER E. And KANBUR ÇAVUŞ, HATİCE K. . "ELECTRICAL PROPERTIES OF Al/p-Si STRUCTURE WITH Al2O3 THIN FILM FABRICATED BY ATOMIC LAYER DEPOSITION SYSTEM." SURFACE REVIEW AND LETTERS , vol.24, no.6, 2017

YILDIZ, D. E. And KANBUR ÇAVUŞ, H. (2017) . "ELECTRICAL PROPERTIES OF Al/p-Si STRUCTURE WITH Al2O3 THIN FILM FABRICATED BY ATOMIC LAYER DEPOSITION SYSTEM." SURFACE REVIEW AND LETTERS , vol.24, no.6.

@article{article, author={DİLBER ESRA YILDIZ And author={HATİCE KANBUR ÇAVUŞ}, title={ELECTRICAL PROPERTIES OF Al/p-Si STRUCTURE WITH Al2O3 THIN FILM FABRICATED BY ATOMIC LAYER DEPOSITION SYSTEM}, journal={SURFACE REVIEW AND LETTERS}, year=2017}