I. Majumdar Et Al. , "Depth profiled XPS analysis and NEXAFS study of Na, K-PDT on CIGSe as a function of deposition temperature using synchrotron radiation," MSE Congress , Darmstadt, Germany, 2016
Majumdar, I. Et Al. 2016. Depth profiled XPS analysis and NEXAFS study of Na, K-PDT on CIGSe as a function of deposition temperature using synchrotron radiation. MSE Congress , (Darmstadt, Germany).
Majumdar, I., ÜMSÜR, B., Heinemann, M. D., Chacko, B., Smirnov, D., Calvet, W., ... Parvan, V.(2016). Depth profiled XPS analysis and NEXAFS study of Na, K-PDT on CIGSe as a function of deposition temperature using synchrotron radiation . MSE Congress, Darmstadt, Germany
Majumdar, Isheta Et Al. "Depth profiled XPS analysis and NEXAFS study of Na, K-PDT on CIGSe as a function of deposition temperature using synchrotron radiation," MSE Congress, Darmstadt, Germany, 2016
Majumdar, Isheta Et Al. "Depth profiled XPS analysis and NEXAFS study of Na, K-PDT on CIGSe as a function of deposition temperature using synchrotron radiation." MSE Congress , Darmstadt, Germany, 2016
Majumdar, I. Et Al. (2016) . "Depth profiled XPS analysis and NEXAFS study of Na, K-PDT on CIGSe as a function of deposition temperature using synchrotron radiation." MSE Congress , Darmstadt, Germany.
@conferencepaper{conferencepaper, author={Isheta Majumdar Et Al. }, title={Depth profiled XPS analysis and NEXAFS study of Na, K-PDT on CIGSe as a function of deposition temperature using synchrotron radiation}, congress name={MSE Congress}, city={Darmstadt}, country={Germany}, year={2016}}