Thickness dependence of magnetic properties of Co90Fe10 nanoscale thin films


Yalcin O., Kazan S., Sahingoez R., Yildiz F., Yerli Y., Aktas B.

JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, vol.8, no.2, pp.841-845, 2008 (Journal Indexed in SCI) identifier identifier identifier

  • Publication Type: Article / Article
  • Volume: 8 Issue: 2
  • Publication Date: 2008
  • Doi Number: 10.1166/jnn.2008.b029
  • Title of Journal : JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY
  • Page Numbers: pp.841-845

Abstract

Ferromagnetic monolayers Co90Fe10 thin films with individual layer thicknesses 2, 6, and 8 nm were grown on thermally oxidized Si substrate and magnetic properties of these were investigated with Ferromagnetic resonance (FMR) technique at room temperature. The magneto resistance (MR) of the samples were measured as a function of applied DC magnetic field and the thickness dependence of the MR was plotted. The FMR spectra were recorded for both parallel and perpendicular geometry. The X-band (9.5 GHz) FMR spectra and resonance field of samples were analyzed and fitted theoretically by using the Landau-Lifshits dynamic equation of motion for magnetization with the Bloch-Bloembergen type damping term. The computer programs have been written to extract the effective magnetization (M), g-values and spin-spin relaxation time (T-2) fitting parameters. The thickness dependence of magnetic parameters has been obtained from experimental data by mean of a theoretical model.