The Production and Characterization of Ytterbium-Stabilized Zirconia Films for SOFC Applications

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Atıf İçin Kopyala

YILDIZ E., YILMAZ S., TÜRKOĞLU O.

INTERNATIONAL JOURNAL OF APPLIED CERAMIC TECHNOLOGY, cilt.13, sa.1, ss.100-107, 2016 (SCI-Expanded)

• Yayın Türü: Makale / Tam Makale
• Cilt numarası: 13 Sayı: 1
• Basım Tarihi: 2016
• Doi Numarası: 10.1111/ijac.12406
• Dergi Adı: INTERNATIONAL JOURNAL OF APPLIED CERAMIC TECHNOLOGY
• Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
• Sayfa Sayıları: ss.100-107
• Yozgat Bozok Üniversitesi Adresli: Evet

Özet

(ZrO2)(1-x)(Yb2O3)(x) binary systems were investigated in the doping range of 0.02x0.12. Ytterbium-doped zirconia powders were synthesized using the Pechini method. X-ray diffraction (XRD) measurements showed that fcc ZrO2 was stabilized for 8-12mol% Yb-doping rate. The produced Yb-stabilized Zr (YbSZ) films were characterized; their thickness and homogeneity properties depended on the nature of the YbSZ slurry. All coating parameters were optimized and determined with precoating treatments. The samples were characterized by differential thermal analysis/thermal gravimetry (DTA/TG), scanning electron microscopy (SEM) and ac impedance measurements.