RF/Microwave Broadband Characterization of Paper Substrates

Ghiri R. E., Dincel Ö., Kameoka J., Entesari K.

IEEE Texas Symposium on Wireless and Microwave Circuits and Systems (WMCS), ELECTR NETWORK, 18 - 20 May 2021 identifier identifier

  • Publication Type: Conference Paper / Full Text
  • Doi Number: 10.1109/wmcs52222.2021.9493218
  • Country: ELECTR NETWORK
  • Keywords: characterization, dielectric constant, microwave circuits, paper substrates, loss tangent, transmission lines, MICROSTRIP
  • Yozgat Bozok University Affiliated: No

Abstract

The accurate knowledge of dielectric substrate characteristics is essential in designing RF and Microwave printed circuit boards. In this work, a straightforward method based on microstrip transmission lines for characterization of paper substrates is implemented. By using this technique, the frequency-dependent behavior of dielectric constant is an element of(r) and loss tangent tan delta of the paper are extracted from 10MHz to 10GHz. To validate this technique, the ADS simulation results and the measurement results of a miniature circuit based on an interdigital capacitor on paper are compared and they show a good agreement.