Thickness dependent investigation of wedged Cu(In,Ga)Se2 films prepared by physical vapor deposition (PVD) using hard x-ray photoelectron spectroscopy (HAXPES)


Calvet W., ÜMSÜR B. , Steigert A., Höpfner B., Lauermann I., Prietzel K., ...More

E-MRS Spring Meeting, Lille, France, 26 - 30 May 2014

  • Publication Type: Conference Paper
  • City: Lille
  • Country: France